Ionized Impurity Scattering in Isotopically Engineered, Compensated Ge:Ga,As

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

77-82

DOI:

10.4028/www.scientific.net/MSF.258-263.77

Citation:

K.M. Itoh et al., "Ionized Impurity Scattering in Isotopically Engineered, Compensated Ge:Ga,As", Materials Science Forum, Vols. 258-263, pp. 77-82, 1997

Online since:

December 1997

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$38.00

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