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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Study of Defects in Diamond Films by Electrical...

Study of Defects in Diamond Films by Electrical Measurements

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

793-798

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.793

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Online since:

December 1997

Authors:

Luís Pereira, Eduarda Pereira, Henrique Leonel Gomes

Keywords:

Diamond Film, Electrical Properties, Microstructure Defects, RAMAN

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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