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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Study of Iron-Related Defects in SI-InP by...

Study of Iron-Related Defects in SI-InP by Positron Annihilation Spectroscopy

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

819-824

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.819

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Online since:

December 1997

Authors:

B. Marí, F.J. Navarro, M.A. Hernández, J.L. Ferrero

Keywords:

Indium Phosphide, Iron, Positron Annihilation, Radiation Damage

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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