Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

825-830

DOI:

10.4028/www.scientific.net/MSF.258-263.825

Citation:

L.F. Sanz et al., "Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes", Materials Science Forum, Vols. 258-263, pp. 825-830, 1997

Online since:

December 1997

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$35.00

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