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HomeMaterials Science ForumMaterials Science Forum Vols. 287-288Structure, Composition and Residual Stresses of...

Structure, Composition and Residual Stresses of Magnesium Fluoride Thin Films Deposited by Direct Evaporation

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Periodical:

Materials Science Forum (Volumes 287-288)

Pages:

255-258

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.287-288.255

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Online since:

August 1998

Authors:

L. Dumas, J.-Y. Robic, Yves Pauleau

Keywords:

Electron Beam Evaporation, MgF₂, RBS, Residual Stress, X-Ray Characterization

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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