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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Time-Resolved Photoluminescence Measurements of...

Time-Resolved Photoluminescence Measurements of InGaN Light-Emitting Diodes

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

1623-1626

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.1623

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Online since:

May 2000

Authors:

Milan Pophristic, F.H. Long, C.A. Tran, Ian T. Ferguson

Keywords:

Carrier Diffusion, Disorder, Time-Resolved Photoluminescence

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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