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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356TEM Investigation of Si Implanted Natural Diamond

TEM Investigation of Si Implanted Natural Diamond

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

199-204

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.199

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Online since:

January 2001

Authors:

Béla Pécz, Á. Barna, V. Heera, F. Fontaine, Wolfgang Skorupa

Keywords:

Diamond, Electron Microscopy, Ion Implantation, Phase Formation

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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