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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Surface Reconstruction on SiC(0001) and...

Surface Reconstruction on SiC(0001) and SiC(000-1): Atomic Structure and Potential Application for Oxidation, Stacking and Growth

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

205-210

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.205

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Online since:

January 2001

Authors:

Ulrich Starke

Keywords:

3C-SiC, 4H-SiC, 6H-SiC, Auger Electron Spectroscopy (AES), C-Face, Heterostructures, Hexagonal Surfaces, Low-Energy Electron Diffraction, Polytype, Reconstruction, Scanning Tunneling Microscopy, SiC(0001), SiC(000-1), Si-Face, Stacking Sequence, Surface Structure

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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