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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Characterization of GaAlN/GaN Superlattice...

Characterization of GaAlN/GaN Superlattice Heterostructures

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

803-806

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.803

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Online since:

January 2001

Authors:

Zs. Makkai, Béla Pécz, M.A. di Forte-Poisson, F. Huet

Keywords:

Inversion Domains, Segregation, Superlattice, Surface Pits

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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