Applications of Mössbauer Spectroscopy to Investigations of Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

1137-1144

DOI:

10.4028/www.scientific.net/MSF.38-41.1137

Citation:

A. Nylandsted-Larsen et al., "Applications of Mössbauer Spectroscopy to Investigations of Defects in Semiconductors", Materials Science Forum, Vols. 38-41, pp. 1137-1144, 1989

Online since:

January 1991

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