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HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Electronic Characterization of Defects in...

Electronic Characterization of Defects in Iron-Doped P-Type Silicon

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Defects in Semiconductors 15

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Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

373-378

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.373

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Online since:

January 1989

Authors:

W. Gehlhoff, K. Irmscher, U. Rehse

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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