Paper Titles

Fluorine-Silicon Reactions and the Etching of Crystalline Silicon
p.335

Photothermal Ionization Spectroscopy
p.341

The Electronic Structure of Platinum, Palladium and Nickel in Silicon
p.355

Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon
p.361

Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon
p.367

Electronic Characterization of Defects in Iron-Doped P-Type Silicon
p.373

Photoluminescence from Defects in Silicon Grown by Molecular Beam Epitaxy
p.379

Electronic Energy Level of Off-Center Substitutional Nitrogen in Silicon
p.385

The Multiconfigurational Carbon-Antimony Pair in Silicon
p.391

HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Perturbed Angular Correlation Spectroscopy of...

Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon

Article Preview

Abstract:

You might also be interested in these eBooks

Defects in Semiconductors 15

Info:

Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

367-372

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.367

Citation:

Cite this paper

Online since:

January 1989

Authors:

Manfred Deicher, G. Grübel, R. Keller, E. Recknagel, N. Schulz, H. Skudlik, Th. Wichert

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1989 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: