Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

361-366

DOI:

10.4028/www.scientific.net/MSF.38-41.361

Citation:

G. Bohnert et al., "Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon", Materials Science Forum, Vols. 38-41, pp. 361-366, 1989

Online since:

January 1991

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Price:

$35.00

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