From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

403-406

DOI:

10.4028/www.scientific.net/MSF.433-436.403

Citation:

J. Pernot et al., "From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks", Materials Science Forum, Vols. 433-436, pp. 403-406, 2003

Online since:

September 2003

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.