From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks

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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

403-406

Citation:

J. Pernot et al., "From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks", Materials Science Forum, Vols. 433-436, pp. 403-406, 2003

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September 2003

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