Structural Defects at SiO2/SiC Interfaces Detected by Positron Annihilation

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

559-562

Citation:

M. Maekawa et al., "Structural Defects at SiO2/SiC Interfaces Detected by Positron Annihilation", Materials Science Forum, Vols. 433-436, pp. 559-562, 2003

Online since:

September 2003

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