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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Relaxation Process in Quenched-In Vacancies During...

Relaxation Process in Quenched-In Vacancies During Annealing in B2 FeAl Single Crystals

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

99-101

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.99

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Online since:

January 2004

Authors:

Tomohide Haraguchi, Fuminobu Hori, Kyosuke Yoshimi, Shuji Hanada, Ryuichiro Oshima, Akihiro Iwase, Hitoshi Hashimoto

Keywords:

Coincidence Doppler Broadening, FeAl, Positron Lifetime, Relaxation Process, Vacancy

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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