X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

363-366

Citation:

T.S. Argunova et al., "X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface ", Materials Science Forum, Vols. 457-460, pp. 363-366, 2004

Online since:

June 2004

Export:

Price:

$38.00

[1] M. Mynbaeva, S.E. Saddow, G. Melnychuk, I. Nikitina, M. Scheglov, A. Sitnikova, N. Kuznetsov, K. Mynbaev and V. Dmitriev: Appl. Phys. Lett. Vol. 78 (2001), p.117.

DOI: https://doi.org/10.1063/1.1337628

[2] S.E. Saddow, M. Mynbaeva, M.C.D. Smith, A.N. Smirnov and V . Dmitriev: Appl. Surf. Sci Vol. 184, (2001), p.72.

[3] B. Raghothamachar, J. Bai, W.M. Vetter, P. Gouma, M. Dudley, M. Mynbaeva, M.T. Smith, S. Saddow: Mat. Res. Symp. Proc. Vol. 742 (2003), p.109.

[4] M. Gutkin, A. Sheinerman, T. Argunova, E. Mokhov, J.H. Je, W-l. Tsai, Y. Huw and G. Margaritondo: Appl. Phys. Lett. Vol. 83 (2003), p.2157.

[5] N Savkina, L. Sorokin, J. Hatchinson, J. Sloan, A. Tregubova, G. Mosina, V. Shuman and V. Ratnikov: Appl. Surf. Sci. Vol. 184 (2001), p.252.

Fetching data from Crossref.
This may take some time to load.