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HomeMaterials Science ForumMaterials Science Forum Vols. 457-460X-Ray Imaging and TEM Study of Micropipes Related...

X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

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Silicon Carbide and Related Materials 2003

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Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

363-366

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.363

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Online since:

June 2004

Authors:

T.S. Argunova, Mikhail Yu. Gutkin, Jung Ho Je, L.M. Sorokin, G.N. Mosina, N.S. Savkina, V.B. Shuman, Alexander A. Lebedev

Keywords:

Micropipe, Porous SiC, Silicon Carbide (SiC), Synchrotron Imaging, TEM

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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