X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

363-366

DOI:

10.4028/www.scientific.net/MSF.457-460.363

Citation:

T.S. Argunova et al., "X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface ", Materials Science Forum, Vols. 457-460, pp. 363-366, 2004

Online since:

June 2004

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$35.00

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