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Depth Profile of Titanium Alloy (Ti-6Al-4V) and Residual Stress Measured by Using X-Ray Diffraction after Metal Cutting Assisted by High-Pressured Jet Cooling Evaluation of Etching Methods: ION Beam (EDOS) and Electro-Chemical Etching

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Periodical:

Materials Science Forum (Volumes 490-491)

Pages:

545-551

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.490-491.545

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Online since:

July 2005

Authors:

Manoucheh Vosough, Ping Liu, Inge Svenningsson

Keywords:

Aerospace Material, Residual Stress, Ti-6Al-4V Alloy, Turning, X-Ray Diffraction (XRD)

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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References

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