Depth Profile of Titanium Alloy (Ti-6Al-4V) and Residual Stress Measured by Using X-Ray Diffraction after Metal Cutting Assisted by High-Pressured Jet Cooling Evaluation of Etching Methods: ION Beam (EDOS) and Electro-Chemical Etching

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Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

545-551

DOI:

10.4028/www.scientific.net/MSF.490-491.545

Citation:

M. Vosough et al., "Depth Profile of Titanium Alloy (Ti-6Al-4V) and Residual Stress Measured by Using X-Ray Diffraction after Metal Cutting Assisted by High-Pressured Jet Cooling Evaluation of Etching Methods: ION Beam (EDOS) and Electro-Chemical Etching", Materials Science Forum, Vols. 490-491, pp. 545-551, 2005

Online since:

July 2005

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$35.00

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