Improvement of 4H-SiC Selective Epitaxial Growth by VLS Mechanism Using Al and Ge Based Melts

Abstract:

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Al-Si and Ge-Si systems were studied for selective epitaxial growth (SEG) of 4H-SiC by the Vapour-Liquid-Solid mechanism. Al-Si and Ge-Si bilayers stackings were deposited on 8° off, Si face, 4H-SiC substrates. After patterning of the layers, the samples were heated up to 1000°C and 1220°C, respectively, for Al-Si and Ge-Si stackings in order to melt the layers. Propane was introduced either during the initial heating ramp, before melting of the alloy, or after reaching the temperature plateau. It was found that introduction of propane before melting was a key parameter in order to improve the homogeneity of the deposit. In both cases, SEG of SiC was achieved. However, the best results were obtained with Ge-Si system giving smooth and uniform ∼100 nm thick epitaxial deposits on all the pattern sizes and shapes. Ge incorporation in the SiC was found to be rather limited but homogeneous in the layer.

Info:

Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

275-278

DOI:

10.4028/www.scientific.net/MSF.527-529.275

Citation:

G. Ferro et al., "Improvement of 4H-SiC Selective Epitaxial Growth by VLS Mechanism Using Al and Ge Based Melts", Materials Science Forum, Vols. 527-529, pp. 275-278, 2006

Online since:

October 2006

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$35.00

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