Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

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Periodical:

Materials Science Forum (Volumes 556-557)

Edited by:

N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall

Pages:

327-330

DOI:

10.4028/www.scientific.net/MSF.556-557.327

Citation:

M. Wagner et al., "Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers", Materials Science Forum, Vols. 556-557, pp. 327-330, 2007

Online since:

September 2007

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$35.00

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