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HomeMaterials Science ForumMaterials Science Forum Vols. 556-557Contactless Electrical Defect Characterization and...

Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

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Silicon Carbide and Related Materials 2006

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Periodical:

Materials Science Forum (Volumes 556-557)

Pages:

327-330

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.556-557.327

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Online since:

September 2007

Authors:

Matthias Wagner, E. Mustafa, S. Hahn, Mikael Syväjärvi, Rositza Yakimova, S. Jang, Sakwe Aloysius Sakwe, Peter J. Wellmann

Keywords:

Contactless Characterization, Photo Induced Current Transient Spectroscopy, Photoluminescence (PL), Sublimation Epitaxy

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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