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Topographical Characterization of Electrodeposited Nickel Nanoparticles on an Indium Tin Oxide on Glass Thin Film

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Abstract:

Topographical characterization of electrodeposited nickel nanoparticles was carried out by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The particles showed a hemispherical growth, typical from a Volmer-Weber growth mechanism. However, they presented different morphology and crystallization types under similar electrochemical conditions. Preferential growth on determined sites on the substrate surface at different electrochemical conditions was also studied, showing that the particle growth strongly depends on the competition of different electrochemical processes, such as Hydrogen Evolution Reaction (HER), which are promoted preferably by the pulse intensity.

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Periodical:

Materials Science Forum (Volume 644)

Pages:

65-68

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.644.65

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Online since:

March 2010

Authors:

Gerardo T. Martinez, Genaro Zavala, Marcelo Videa

Keywords:

Atomic Force Microscope (AFM), Characterization, Electro-Deposition, Nickel Nanoparticle

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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