Topographical Characterization of Electrodeposited Nickel Nanoparticles on an Indium Tin Oxide on Glass Thin Film

Abstract:

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Topographical characterization of electrodeposited nickel nanoparticles was carried out by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The particles showed a hemispherical growth, typical from a Volmer-Weber growth mechanism. However, they presented different morphology and crystallization types under similar electrochemical conditions. Preferential growth on determined sites on the substrate surface at different electrochemical conditions was also studied, showing that the particle growth strongly depends on the competition of different electrochemical processes, such as Hydrogen Evolution Reaction (HER), which are promoted preferably by the pulse intensity.

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Periodical:

Edited by:

Arturo Ponce and Darío Bueno

Pages:

65-68

DOI:

10.4028/www.scientific.net/MSF.644.65

Citation:

G. T. Martinez et al., "Topographical Characterization of Electrodeposited Nickel Nanoparticles on an Indium Tin Oxide on Glass Thin Film", Materials Science Forum, Vol. 644, pp. 65-68, 2010

Online since:

March 2010

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$35.00

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