Single-Crystal SiC Resonators by Photoelectrochemical Etching

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Abstract:

In this paper, we report single-crystal 4H-SiC resonant structures fabricated by dopant-selective photoelectrochemical etching. The frequency response of the resonant beams was characterized by a dynamic scanning method using AFM with the beams excited by a piezoelectric actuator under atmosphere pressure and room temperature. The beam with a length of 35 μm shows mechanical resonance at 945 kHz. The Young’s modulus of single-crystal SiC was derived from the measured resonant frequency. Single-crystal 4H-SiC resonators developed in this study fully exploit the excellent electrical, mechanical, and chemical properties of SiC, while dopant-selective photoelectrochemical etching technique significantly simplifies the fabrication process.

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Periodical:

Materials Science Forum (Volumes 717-720)

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529-532

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Online since:

May 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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