Study of Epitaxial Graphene on Non-Polar 6H-SiC Faces

Article Preview

Abstract:

We present epitaxial graphene (EG) growth on non-polar a-plane and m-plane 6H-SiC faces where material characterization is compared with that known for EG grown on polar faces. AFM surface morphology exhibits nanocrystalline graphite like features for non-polar faces, while polar silicon face shows step like features. This differing behavior is attributed to the lack of a hexagonal template on the non-polar faces. Non-polar faces also exhibit greater disorder and red shift of all Raman peaks (D, G and 2D) with increasing temperature. This is attributed to decreasing stress with increasing temperature. These variations provide evidence of different EG growth mechanisms on non-polar and polar faces, likely due to differences in surface free energy. We also present differences between a-plane ( ) EG and m-plane ( ) EG in terms of morphology, thickness and Raman characteristics.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 717-720)

Pages:

633-636

Citation:

Online since:

May 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] A.H. Castro Neto et al., Rev. Mod. Phys. 81 (2009) 109

Google Scholar

[2] A.K. Geim and K.S. Novoselov, Nat. Mater. 6 (2007) 183

Google Scholar

[3] Jahan M. Dawlaty, et al., Appl. Phys. Lett. 93 (2008) 131905

Google Scholar

[4] M. Hupalo, E. Conrad,and M. C. Tringides, arXiv:0809.3619v1

Google Scholar

[5] Luxmi, N. Srivastava et al., Phys. Rev. B 82 (2010) 235406

Google Scholar

[6] J. L. Tedesco, G. G. Jernigan, et al., Appl. Phys. Lett. 96 (2010) 222103

Google Scholar

[7] A.C Ferrari and J. Robertson, Phys. Rev. B 61 (2000) 14095-14107

Google Scholar

[8] B.K. Daas et al., J. Appl. Phys.  110 (2011) 113114

Google Scholar

[9] Eric Pearson and William A Tiller, Journal of Crystal Growth 70 (1984) 33

Google Scholar

[10] P.J. Cumpson, Surf. Interface Anal. 29 (2000) 403

Google Scholar