Two-Dimensional Mapping of Localized Characteristics of Concentrator Photovoltaic Module

Hiroto Yano; Hirokazu Nagai; Kazuyuki Tamura; Kenji Araki; Kensuke Nishioka

doi:10.4028/www.scientific.net/MSF.725.187

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Evaluation of Organic Thin Film Solar Cells Using 3-Diode Equivalent Circuit Model with Inverted Diode
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2-Dimensional Mapping of Power Consumption Due to Electrode Resistance Using Simulator for Concentrator Photovoltaic Module
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Two-Dimensional Mapping of Localized Characteristics of Concentrator Photovoltaic Module
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Mono Vacancy Generation by Short Annealing in Nitrogen Doped FZ Silicon Wafers
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HomeMaterials Science ForumMaterials Science Forum Vol. 725Two-Dimensional Mapping of Localized...

Two-Dimensional Mapping of Localized Characteristics of Concentrator Photovoltaic Module

Abstract:

For the development of concentrator photovoltaic (CPV) module realizing high efficiency, it is necessary to achieve the high efficiency optical system including Fresnel lens and homogenizer. For the improvement of optical systems, it is very important to understand the contribution of the light irradiated to a localized position on the Fresnel lens. The light beam induced current (LBIC) system was constructed to evaluate the focusing characteristic of the CPV module. We locally irradiated a light from solar simulator to the CPV mini-module and measured the generation current, and the localized characteristics were represented by two-dimensional mappings. Moreover, we evaluated the influence of tracking error by changing the irradiation angle. In the case of tracking errors, the peak of generated current was shifted and the current was decreased. In the case of tracking error of 1.0 o, the total generated current was reduced 12%, in comparison with the normal irradiance.

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Materials Science Forum (Volume 725)

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187-190

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https://doi.org/10.4028/www.scientific.net/MSF.725.187

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Online since:

July 2012

Authors:

Hiroto Yano, Hirokazu Nagai, Kazuyuki Tamura, Kenji Araki, Kensuke Nishioka

Keywords:

CPV, LBIC, Tracking Error

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References

[1] M. Yamaguchi, Sol. Energy Mater. Sol. Cells 75, 261-269 (2003).

Google Scholar

[2] K. Araki, M. Hiramatsu, H. Ito, Y. Kemmoku, M. Yamaguchi, Process, Proc. 22nd European Photovoltaic Solar Energy Conference 148-152 (2007).

Google Scholar

[3] G. Peharz, J. Jaus,P. Nitz, T. Schmidt, T. Schult, A.W. Bett, Process, Proc. 23nd European Photovoltaic Solar Energy Conference 865-868 (2008).

Google Scholar

[4] J. Jaus, G. Peharz, A. Gombert, J. P. F. Rodriguez, F. Dimroth, F. Eltermann, O. Wolf, M. Passig, G. Siefer, A. Hakenjos, S. V. Riesen, A. W. Bett, Proc. 34th IEEE Photovoltaic Specialists Conf. 1931-1936 (2009).

DOI: 10.1109/pvsc.2009.5411559

Google Scholar

[5] B. Furman, E. Menard, A. Gray, M. Meitl, S. Bonafede, D. Kneeburg, K. Ghosal, W. Wagner, J. Gabriel, S. Seel, R. Bukovnik, S. Burroughs, Proc. 35th IEEE Photovoltaic Specialists Conf. 475-480 (2010).

DOI: 10.1109/pvsc.2010.5616766

Google Scholar

[6] S. Vasylyev, V. Vasylyev, V. Sergeev, Proc. 35th IEEE Photovoltaic Specialists Conf. 3087-3091 (2010).

DOI: 10.1109/pvsc.2010.5614474

Google Scholar