MicroRaman Spectroscopy of Si Nanowires: Influence of Size

Julián Anaya; Carmelo Prieto; Alfredo Torres; Alonso Martín-Martín; Jorge Souto; Juan Jiménez; Andres Rodríguez; Tomás Rodríguez

doi:10.4028/www.scientific.net/MSF.725.255

Paper Titles

Impact of RTA on the Morphology of Oxygen Precipitates and on the Getter Efficiency for Cu and Ni in Si Wafers
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Density Functional Theory Analysis on Behavior of Metal Impurities in Ge (100) / Si (100)
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Effect of Si₃N₄ Coating on Strain and Fracture of Si Ingots
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Evaluation of Optical Properties for Nanocrystal Si Dot Layers Fabricated by CVD as a Function of Size Reduction
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MicroRaman Spectroscopy of Si Nanowires: Influence of Size
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Electron-Beam-Induced Current Study of Electronic Property Change at SrTiO₃ Bicrystal Interface Induced by Forming Process
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Structural and Electronic Structure of SnO₂ by the First-Principle Study
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XRD Investigation of the Crystalline Quality of Sn Doped β-Ga₂O₃ Films Deposited by the RF Magnetron Sputtering Method
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Improvement of the Crystalline Quality of β-Ga₂O₃ Films by High-Temperature Annealing
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HomeMaterials Science ForumMaterials Science Forum Vol. 725MicroRaman Spectroscopy of Si Nanowires: Influence...

MicroRaman Spectroscopy of Si Nanowires: Influence of Size

Abstract:

Si Nanowires (NWs) were studied by Raman microspectroscopy. The Raman spectrum of the NWs reveals important thermal effects, which broaden and shift the one phonon Raman bands. The low thermal conductivity of the NWs and the low thermal dissipation are responsible for the temperature enhancement in the NW under the excitation with the laser beam. We have modeled, using finite element methods, the interaction between the laser beam and the NWs. The Raman spectrum of Si NWs is interpreted in terms of the temperature induced by the laser beam excitation, in correlation with finite element methods (fem) for studying the interaction between the laser beam and the NWs.

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Materials Science Forum (Volume 725)

Pages:

255-258

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.725.255

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Online since:

July 2012

Authors:

Julián Anaya, Carmelo Prieto, Alfredo Torres, Alonso Martín-Martín, Jorge Souto, Juan Jiménez, Andres Rodríguez, Tomás Rodríguez

Keywords:

Nanowire, Raman Spectroscopy, Si, Temperature

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