Rotated Epitaxy of 3C-SiC(111) on Si(110) Substrate Using Monomethylsilane-Based Gas-Source Molecular-Beam Epitaxy

Abstract:

3C-SiC is the only polytype that grows heteroepitaxially on Si substrates and, therefore, it is of high interest for various potentail applications. However, the large (~20 %) lattice mismatch of SiC with the Si substrate causes a serious problem. In this respect, rotated epitaxy of 3C-SiC(111) on the Si(110) substrate is highly promising because it allows reduction of the lattice mismatch down to a few percent. We have systematically searched the growth conditions for the onset of this rotated epitaxy, and have found that the rotaed epitaxy occurrs at higher growth temperatures and at lower source-gas pressures. This result indicates that the rotated epitaxy occurs under growth conditions that are close to the equilibrium and is thefore thermodynamically, rather than kinetically, driven.

• Periodical: Materials Science Forum (Volumes 740-742)
• Pages: 339-343
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.740-742.339
• Online since: January 2013
• Authors: Shota Sambonsuge, Eiji Saito, Myung Ho Jung, Hirokazu Fukidome, Sergey Filimonov, Maki Suemitsu
• Keywords: Epitaxy, Graphen, Monomethylsilane, Silicon, X-Ray Diffraction (XRD)

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