Subnanosecond Semiconductor Opening Switch Based on 4H-SiC Junction Diode

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Abstract:

Mesa-epitaxial 4H-SiC p+-p-no-n+-diodes were fabricated and their reverse recovery characteristics were measured in pulse regimes to be relevant to DSRD- and SOS-modes of operation [I.V. Grekhov, G.A. Mesyats, Physical basis for high-power semiconductor nanosecond opening switches, IEEE Transactions on Plasma Science 28 (2000) 1540-1544]. It has been found that after short pumping the diodes by forward current pulse (5-ns duration, 200-A/cm2 peak current density) followed by applying the reverse voltage pulse (rise time 2 ns) the diodes are able to interrupt the reverse current density of 3.5 - 25 kA/cm2 in a time less than 0.3 ns.

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Periodical:

Materials Science Forum (Volumes 740-742)

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865-868

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Online since:

January 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] I.V. Grekhov, G.A. Mesyats, Physical basis for high-power semiconductor nanosecond opening switches, IEEE Transactions on Plasma Science 28 (2000) 1540-1544.

DOI: 10.1109/27.901229

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[2] I.V. Grekhov, P.A. Ivanov, D.V. Khristyuk, A.O. Konstantinov, S.V. Korotkov, T.P. Samsonova, Sub-nanosecond semiconductor opening switches based on 4H-SiC p+-po-n+-diodes, Solid-State Electronics 47 (2003) 1769-1774.

DOI: 10.1016/s0038-1101(03)00157-6

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