Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors

Yu Dong Xia; Jie Xiong; Fei Zhang; Yan Xue; Kai Hu; Xiao Hui Zhao; Bo Wan Tao

doi:10.4028/www.scientific.net/MSF.787.425

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HomeMaterials Science ForumMaterials Science Forum Vol. 787Characterisation of YSZ Layers Deposited on Y2O3...

Characterisation of YSZ Layers Deposited on Y₂O₃Buffered Textured Tapes for Coated Conductors

Abstract:

Yttria-stabilized zirconia (YSZ) films were deposited on Y₂O₃/Ni-5at.%W substrates serving as the barrier layers for coated conductors by reel-to-reel direct-current (D.C.) magnetron reactive sputtering. The deposition parameters, such as the substrate temperature and tape moving speed, were systematically investigated. X-ray diffraction analysis confirmed that optimized YSZ/Y₂O₃ buffer layers showed excellent in-plane and out-of-plane textures. Atomic force microscope revealed a smooth, dense and crack-free surface. The subsequent CeO₂ cap layer and 1μm-thick YBa₂Cu₃O_7-δ film sequentially prepared, showing the critical current density J_c under 77K, self-field of 1.4MA/cm².

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Periodical:

Materials Science Forum (Volume 787)

Pages:

425-430

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.787.425

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Online since:

April 2014

Authors:

Yu Dong Xia*, Jie Xiong, Fei Zhang, Yan Xue, Kai Hu, Xiao Hui Zhao, Bo Wan Tao

Keywords:

Biaxial Texture, Reactive Sputtering, YBa₂Cu₃O_7-δ, YSZ Barrier Layer

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