A Reevaluation of Electric-Field Enhanced Emission Measurements for Use in Type and Charge State Determination of Point Defects

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Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

1153-1158

Citation:

W.R. Buchwald et al., "A Reevaluation of Electric-Field Enhanced Emission Measurements for Use in Type and Charge State Determination of Point Defects", Materials Science Forum, Vols. 83-87, pp. 1153-1158, 1992

Online since:

January 1992

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$38.00

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