Paper Titles

ONP Spectroscopy of Defects in Silicon
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Nuclear Spin Polarization by Optical Pumping of Nitrogen Impurities in Semiconductors
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On the Analysis of Digital DLTS Data
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A Reevaluation of Electric-Field Enhanced Emission Measurements for Use in Type and Charge State Determination of Point Defects
p.1153

X-Ray Spectroscopy Following Neutron Irradiation of Semiconductor Silicon
p.1159

Spin Dependent Recombination at Deep Centers in Si - Electrically Detected Magnetic Resonance
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Excited Defect Energy States from Temperature Dependent ESR
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Dislocation Associated Defects in Gallium Arsenide by Scanning Tunneling Microscopy
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Transition Metals in Silicon Carbide (SiC): Vanadium and Titanium
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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87X-Ray Spectroscopy Following Neutron Irradiation...

X-Ray Spectroscopy Following Neutron Irradiation of Semiconductor Silicon

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1159-1164

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1159

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Online since:

January 1992

Authors:

A.J. Filo, A.J. Meyer, C.C. Swanson, J.P. Lavine

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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