The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise

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Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

1519-1530

DOI:

10.4028/www.scientific.net/MSF.83-87.1519

Citation:

M. J. Uren "The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise", Materials Science Forum, Vols. 83-87, pp. 1519-1530, 1992

Online since:

January 1992

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$35.00

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