The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

1519-1530

Citation:

M. J. Uren, "The Properties of Individual Si/SiO2 Defects and Their Link to 1/F Noise", Materials Science Forum, Vols. 83-87, pp. 1519-1530, 1992

Online since:

January 1992

Authors:

Export:

Price:

$38.00