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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Comparison between Defects Introduced during...

Comparison between Defects Introduced during Electron Beam Evaporation of Pt and Ti on n-GaAs

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1499-1502

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1499

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Online since:

January 1992

Authors:

F. Danie Auret, G. Myburg, L.J. Bredell, W.O. Barnard, H.W. Kunert

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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