Wafer-Scale Graphene on 4-Inch SiC

Article Preview

Abstract:

Wafer-scale graphene on SiC with uniform structural features was grown on semi-insulating 4 inch on-axis 4H-SiC (0001) face. Growth was carried out in a conventional physical vapor transport (PVT) growth system. Atmospheric pressure graphitization and a “face-down” orientation were account for the high uniformity of graphene. Atomic force microscopy, electrostatic force microscopy and Raman spectroscopy were used to confirm the uniformity of surface morphology and layer number. Electrical properties were also characterized by Hall measurements on 15×15mm2 samples sawed from the wafer. An average Hall mobility of about 2000cm2/Vs was obtained.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

1133-1136

Citation:

Online since:

May 2016

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2016 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Bae S, Kim H, Lee Y, et al. Roll-to-roll production of 30-inch graphene films for transparent electrodes, Nature nanotechnology 5 (2010) 574-578.

DOI: 10.1038/nnano.2010.132

Google Scholar

[2] Emtsev K V, Bostwick A, Horn K, et al. Towards wafer-size graphene layers by atmospheric pressure graphitization of silicon carbide, Nature materials 8 (2009) 203-207.

DOI: 10.1038/nmat2382

Google Scholar

[3] Jia Y P, Guo L W, Lin J J, et al. Wafer-scale graphene on 2 inch SiC with uniform structural and electrical characteristics, Chinese Science Bulletin 57(2012) 3022-3025.

DOI: 10.1007/s11434-012-5161-8

Google Scholar

[4] Hu X, Xu X, Li X, et al. Stacking faults in SiC crystal grown by spontaneous nucleation sublimation method, Journal of Crystal Growth 292 (2006) 192-196.

DOI: 10.1016/j.jcrysgro.2006.04.005

Google Scholar

[5] Kim M, Hwang J, Shields V B, et al. SiC surface orientation and Si loss rate effects on epitaxial grapheme, Nanoscale research letters 7 (2012) 1-6.

DOI: 10.1186/1556-276x-7-186

Google Scholar

[6] Ning L, Hu X, Wang Y, et al. Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography, Journal of Applied Crystallography 42 (2009) 1068-1072.

DOI: 10.1107/s002188980904196x

Google Scholar

[7] Robinson J A, Puls C P, Staley N E, et al. Raman topography and strain uniformity of large-area epitaxial grapheme, Nano letters, 9 (2009) 964-968.

DOI: 10.1021/nl802852p

Google Scholar

[8] Lin Y M, Farmer D B, Jenkins K, et al. Enhanced performance in epitaxial graphene FETs with optimized channel morphology, Electron Device Letters, IEEE 32 (2011) 1343-1345.

DOI: 10.1109/led.2011.2162934

Google Scholar

[9] Curtin A E, Fuhrer M S, Tedesco J L, et al. Kelvin probe microscopy and electronic transport in graphene on SiC (0001) in the minimum conductivity regime, Applied Physics Letters 98 (2011) 243111.

DOI: 10.1063/1.3595360

Google Scholar