Effects of Annealing on Ferroelectric, Optical and Electrically Controlled Light Scattering Properties of PLZT Transparent Ceramics

Abstract:

PLZT (X/70/30) ceramics with different La contents (X=7.45, 7.54, 7.63 mole%) were fabricated by hot-press sintering techniques. The effects of annealing on ferroelectric, optical and electrically controlled light scattering properties of PLZT transparent ceramics were examined and analyzed. The XRD patterns indicated that all the samples were crystallized into a pure perovskite phase without the second phase. The SEM exhibited fully dense, uniform microstructures with well-developed grains. The annealing treatment weakened the degree of squareness of the ferroelectric hysteresis loop, and even the anti-ferroelectric phase occurred as the La content increasing to X=7.63. The remnant polarization (Pr) and coercive electric field (Ec) decreased with the annealing treatment for all samples. The slow annealing treatment resulted in the lager increase of both transmittance and contrast ratio than those of the rapid annealing treatment at λ=632.8nm. The electrically controlled light scattering properties were obviously enhanced by the annealing treatment. Especially, the PLZT (7.63/70/30) ceramics exhibited the different electrically controlled light scattering performance which indicated it could hold high transmittance and symmetry in a wide electric field range with the slow annealing treatment.

• Periodical: Materials Science Forum (Volume 898)
• Pages: 1686-1692
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.898.1686
• Online since: June 2017
• Authors: Lei Tao Nie, Xi Yun He*, Xia Zeng, Ping Sun Qiu, Wen Xiu Cheng, Cheng Kang Chang
• Keywords: Annealing, Light Scattering, PLZT, Transparent Ceramic

References

[1] G.H. Haertling, C.E. Land, Hot-Pressed (Pb, La)(Zr, Ti)O3 Ferroelectric Ceramics for Electrooptic Applications, J. Am. Ceram. Soc., 54 (1971) 1-11.

DOI: 10.1111/j.1151-2916.1970.tb12105.x-i1

[2] G.H. Haertling, Improved Hot-Pressed Electrooptic Ceramics in the (Pb, La)(Zr, Ti)O3 System, J. Am. Ceram. Soc., 54 (2006) 303-309.

DOI: 10.1111/j.1151-2916.1971.tb12296.x

[3] W.D. Smith, C.E. Land, Scattering‐Mode Ferroelectric‐Photoconductor Image Storage and Display Devices, Appl. Phys. Lett, 20 (1972) 169-171.

DOI: 10.1063/1.1654095

[4] A. Kumada, G. Toda, Y. Otomo, An electrooptic image storage device using field induced reversible transitions between AFE and FE phases of PLZT ceramics, Ferroelectrics, 7 (1974) 367-369.

DOI: 10.1080/00150197408238049

[5] A. Kumada, K. Suzuki, G. Toda, DISPLAY APPLICATIONS OF FIELD-ENFORCED PHASE-TRANSITION IN PLZT CERAMICS, Ferroelectrics, 10 (1976) 25-28.

DOI: 10.1080/00150197608241944

[6] C.E. Land, Photoferroelectric image storage in antiferroelectric-phase PLZT ceramics, Ieee. T. Electron. Dev, 26 (1979) 1143-1147.

DOI: 10.1109/t-ed.1979.19565

[7] T. Ohashi, H. Hosaka, T. Morita, Light Transmittance Memory Effect of Ferroelectric Materials Induced by Electrical Imprint Field, in: K. Shirase, S. Aoyagi (Eds. ) Service Robotics and Mechatronics: Selected Papers of the International Conference on Machine Automation ICMA2008, Springer London, London, 2010, pp.363-366.

DOI: 10.1007/978-1-84882-694-6_64

[8] X. Yao, Z. Chen, L.E. Cross, Polarization and depolarization behavior of hot pressed lead lanthanum zirconate titanate ceramics, J. Appl. Phys., 54 (1983) 3399-3403.

DOI: 10.1063/1.332453

[9] B. Xia, X.Y. He, X.S. Zheng, P.S. Qiu, W.X. Cheng, X. Zeng, Electrically induced light scattering performances of lanthanum-modified lead zirconate titanate transparent ceramics, J. Electroceram., 29 (2012) 192-197.

DOI: 10.1007/s10832-012-9760-1

[10] B. Xia, X.Y. He, X.S. Zheng, P.S. Qiu, W.X. Cheng, X. Zeng, Light Scattering Properties for PLZT Transparent Ceramics of Different Zr/Ti Ratios, in: W. Pan, J.H. Gong (Eds. ) High-Performance Ceramics Vii, Pts 1 and 2, Trans Tech Publications Ltd, Stafa-Zurich, 2012, pp.1537-1540.

DOI: 10.4028/www.scientific.net/kem.512-515.1537

[11] X. Zhang, B. Xia, Z. Xia, P. Qiu, W. Cheng, X. He, Temperature Dependence of Electric‐induced Light Scattering Performance for PLZT Ceramics, J. Am. Ceram. Soc., 97 (2014) 1389-1392.

DOI: 10.1111/jace.12936

[12] S. Wagner, D. Kahraman, H. Kungl, M.J. Hoffmann, C. Schuh, K. Lubitz, H. Murmann-Biesenecker, J.A. Schmid, Effect of temperature on grain size, phase composition, and electrical properties in the relaxor-ferroelectric-system Pb(Ni1∕3Nb2∕3)O3-Pb(Zr, Ti)O3, J. Appl. Phys., 98 (2005).

DOI: 10.1063/1.1968427

[13] B. Xia, X. He, D. Sun, W. Cheng, P. Qiu, X. Zeng, The electrically controlled light scattering performances of PLZT transparent ceramics, Ceram. Int., 41, Supplement 1 (2015) S246-S249.

DOI: 10.1016/j.ceramint.2015.03.245

[14] X.N. Zhang, X.Y. He, B. Xia, P.S. Qiu, W.X. Cheng, X. Zeng, Lanthanum Dependence of the Electrically Controlled Light Scattering Performances of PLZT Transparent Ceramics, in: W. Pan, J. Gong (Eds. ) High-Performance Ceramics Viii, Trans Tech Publications Ltd, Stafa-Zurich, 2014, pp.998-1003.

DOI: 10.4028/www.scientific.net/kem.602-603.998

[15] J. Zeng, G. Li, R. Wei, L. Zheng, H. Zeng, A. Ding, Q. Yin, The influence of domain structure on the optical and electrical properties of transparent (Pb, La)(Mg1/3Nb2/3)O3–PbTiO3 ceramics, Ceram. Int., 39 (2013) S31–S34.

DOI: 10.1016/j.ceramint.2012.10.030

[16] C.E. Land, P.D. Teacher, G.H. Haertling, Electrooptic Ceramics, in: W. Raymond (Ed. ) Applied Solid State Science, Elsevier1974, pp.137-233.

DOI: 10.1016/b978-0-12-002904-4.50010-3

[17] Q. Yin, B. zhu, Microstructure, Property and Processing of Functional Ceramics, Beijing Metallurgical Industry Press, Beijing, (2005).