Microstructures and Dielectric Properties of CaCu3Ti4O12 Polycrystalline Ceramics

Abstract:

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We report important factors affecting the dielectric properties of CaCu3Ti4O12 (CCTO) polycrystalline ceramics prepared by the conventional solid-state ceramic process. The relative dielectric constants (εr) up to several thousands (~ 3,000 at 1 kHz) were gradually increased with increasing the sintered density of samples in the case that no exaggerated grain growth occurred. An abrupt increase in εr values were, however, accompanied by the formation of abnormally grown large grains, and thus with increasing the population of abnormally grown grains, which could be achieved by a prolonged sintering at 1060°C, the εr values were remarkably increased from several thousands to ~105. Optimally processed CCTO sample exhibited a very high εr of ~ 90,000 at 1 kHz.

Info:

Periodical:

Solid State Phenomena (Volumes 124-126)

Edited by:

Byung Tae Ahn, Hyeongtag Jeon, Bo Young Hur, Kibae Kim and Jong Wan Park

Pages:

143-146

DOI:

10.4028/www.scientific.net/SSP.124-126.143

Citation:

D. K. Yoo and S. I. Yoo, "Microstructures and Dielectric Properties of CaCu3Ti4O12 Polycrystalline Ceramics", Solid State Phenomena, Vols. 124-126, pp. 143-146, 2007

Online since:

June 2007

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Price:

$35.00

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