Paper Titles

Dislocation Kink Dynamics and Gettering Processes in Semiconductors
p.311

Local Distribution of Structure Defects Induced by Microhardness Indentation in GaAs
p.323

Dynamics of a Dislocation in the Potential Relief of Semiconductor Crystals under Varying Applied Forces
p.329

Peculiarities of Dislocation Luminescence of Covalent Semiconductors
p.335

Defects in Multicrystalline Silicon
p.341

Origin of Recombination at Extended Defects: EBIC Contrast Experiments and Theory on Dislocations in GaAs
p.353

Electrical Properties of Dislocation Impurity Atmospheres in Si
p.367

Electrical Properties of Defects in Multicrystalline Silicon
p.373

Process Induced Defects in TiSi₂-N⁺/P-Structures
p.379

HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20Defects in Multicrystalline Silicon

Defects in Multicrystalline Silicon

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Gettering and Defect Engineering in Semiconductor Technology IV

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Periodical:

Solid State Phenomena (Volumes 19-20)

Pages:

341-352

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20.341

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Online since:

January 1991

Authors:

R. Schindler, A. Räuber

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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