Synchrotron Radiation X-Ray Topography of Growth Striations in Magnetic-Field-Applied Czochralski Silicon

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Periodical:

Solid State Phenomena (Volumes 19-20)

Edited by:

M. Kittler and H. Richter

Pages:

429-438

DOI:

10.4028/www.scientific.net/SSP.19-20.429

Citation:

S. Kawado et al., "Synchrotron Radiation X-Ray Topography of Growth Striations in Magnetic-Field-Applied Czochralski Silicon", Solid State Phenomena, Vols. 19-20, pp. 429-438, 1991

Online since:

January 1991

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$35.00

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