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Nonlinear Recombination and Diffusion Processes in Si and GaAs
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Carrier Recombination Processes in PbTe Films by Picosecond IR Excitation
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Investigation on Electrical Contacts on N-Type Silicon
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Diagnostics of Defects from the Noise Spectra
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Statistical Analysis of the Assembly-Induced Degradation of the Silicon Device Parameters
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Mechanical Strain Relaxation during Lattice-Mismatched Epitaxial Growth
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HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20Investigation on Electrical Contacts on N-Type...

Investigation on Electrical Contacts on N-Type Silicon

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Gettering and Defect Engineering in Semiconductor Technology IV

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Periodical:

Solid State Phenomena (Volumes 19-20)

Pages:

529-534

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20.529

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Online since:

January 1991

Authors:

Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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