Defect Generation and Propagation in Mc-Si Ingots: Influence on the Performance of Solar Cells

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This paper describes results of our study aimed at understanding mechanism (s) of dislocation generation and propagation in multi-crystalline silicon (mc-Si) ingots, and evaluating their influence on the solar cell performance. This work was done in two parts: (i) Measurement of dislocation distributions along various bricks, selected from strategic locations within several ingots; and (ii) Theoretical modeling of the cell performance corresponding to the measured dislocation distributions. Solar cells were fabricated on wafers of known dislocation distribution, and the results were compared with the theory. These results show that cell performance can be accurately predicted from the dislocation distribution, and the changes in the dislocation distribution are the primary cause for variations in the cell-to-cell performance. The dislocation generation and propagation mechanisms, suggested by our results, are described in this paper.

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Solid State Phenomena (Volumes 205-206)

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55-64

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October 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] B. Sopori, P. Rupnowski, S. Shet, and V. Mehta, Defects in Multicrystalline Silicon: Influence on the Solar Cell Performance, 6th Forum on the Science and Technology of Silicon Materials, Okayama, Japan, (2010) 213–224.

DOI: 10.1109/pvsc.2010.5616552

Google Scholar

[2] B. Sopori and R. Murphy, Theoretical analysis of a large area inhomogeneous solar cell, Proc. 12th European Photovoltaic Solar Energy Conference, (1994) 1797-1799.

Google Scholar

[3] B. Sopori, Efficiency Limitations on Multicrystalline Silicon Solar Cells Due to Defect Clusters, in G. Davies and M.H. Nazare (Eds. ), Proc. ICDS-19, Trans Tech Pub, (1997), p.527.

DOI: 10.1557/proc-864-e6.2

Google Scholar

[4] A. Simo, and S. Martinuzzi, Hot Spot and heavily dislocated regions in multicrystalline Silicon Solar Cell, Proc. 21st IEEE Photovoltaic Specialists Conference, USA, (1990), p.800.

DOI: 10.1109/pvsc.1990.111730

Google Scholar

[5] M. Seibt, R. Khalil, V. Kveder and W. Schroter, Electronic states at dislocations and metal silicide precipitates in crystalline silicon and their role in solar cell materials, Appl Phys A, 96, (2009), 235–253.

DOI: 10.1007/s00339-008-5027-8

Google Scholar

[6] J. Rabier, P. Cordier, J. L. Dement, and H. Garem, Plastic deformation of Si at low temperature under high confining pressure, Mater. Sci. Eng. A, 309-310, (2001), 74-77.

DOI: 10.1016/s0921-5093(00)01770-6

Google Scholar

[7] M. Kittler, C. Ulhaq-Bouillet, and V. Higgs, Influence of copper contamination on recombination activity of misfit dislocations in SiGe/Si epilayers: Temperature dependence of activity as a marker characterizing the contamination level, J. Appl. Phys. 78, (1995).

DOI: 10.1063/1.359802

Google Scholar

[8] V. Higgs, and M. Kittler, Influence of hydrogen on the electrical and optical activity of misfit dislocations in Si/SiGe epilayers, Appl. Phys. Lett. 65, (1994), 2804- 2806.

DOI: 10.1063/1.112571

Google Scholar

[9] J.G. Fossum and F.A. Lindholm, Theory of grain-boundary and intragrain recombination currents in polysilicon p-n-junction solar cells, IEEE Trans. ED-27 692 (1980).

DOI: 10.1109/t-ed.1980.19924

Google Scholar

[10] B.L. Sopori, R.A. Murphy, and C. Marshall, A scanning defect-mapping system for large-area silicon substrates, Proc. 23rd IEEE Photovoltaic Specialists Conference, Louisville, Kentucky, (1993), 190.

DOI: 10.1109/pvsc.1993.347055

Google Scholar

[11] B.L. Sopori, Fabrication of diode arrays for photovoltaic characterization of silicon substrates, Appl. Phys. Lett. 52 (1988) 1718.

DOI: 10.1063/1.99027

Google Scholar