Surface Cleaning Challenges for Organic Light Emitting Diodes

Noel Giebink

doi:10.4028/www.scientific.net/SSP.314.3

Paper Titles

Surface Cleaning Challenges for Organic Light Emitting Diodes
p.3

Characterization and Removal of Metallic Contamination in H₂O and H₂O₂ Using Single Particle Inductively Coupled Plasma Mass Spectrometry
p.9

Direct Analysis of Ultra Trace Metallic Particles in NH₃ and HCl Gases by Gas Exchange Device (GED)-ICP-MS
p.17

Investigation of Contaminants in Single Wafer Wet Cleaning Using Isopropyl Alcohol
p.23

Cl-Containing Microplastics from the Environment
p.29

Experimental Wafer Carrier Contamination Analysis and Monitoring in Fully Automated 300 mm Power Production Lines
p.34

Wafer Container Monitoring Concerning Airborne Molecular Contaminations along a 300 mm Power Semiconductor Production Flow
p.41

Towards Si-Cap-Free SiGe Passivation: Impact of Surface Preparation on Low-Pressure Oxidation of SiGe
p.49

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Surface Cleaning Challenges for Organic Light Emitting Diodes

Abstract:

Organic optoelectronic devices such as light-emitting diodes and solar cells present unique challenges for surface cleaning and preparation because of their large area and the ‘soft’, thin film nature of the materials involved. This paper gives an introduction to this class of semiconductor devices and covers a recent example of how surface cleaning impacts the long-term reliability of organic light-emitting diodes being commercialized for solid-state lighting.

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Periodical:

Solid State Phenomena (Volume 314)

Pages:

3-8

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.314.3

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Online since:

February 2021

Authors:

Noel Giebink*

Keywords:

Defects, Lighting, Organic Light Emitting Diode, Organic Semiconductor, Reliability

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