Chemical Composition of Alloys as Primary Material Property Influencing the Accuracy of Measurements Obtained in Energy-Dispersive X-Ray Spectroscopy (EDS), Wavelength-Dispersive X-Ray Spectroscopy (WDX) and X-Ray Fluorescence (XRF)

Abstract:

The properties of the material affect the quality of the manufactured product. Before transferring the finished product to the production phase and sending it to the customer, material tests should be carried out. Examined material properties such as chemical composition, phase composition, grain boundaries influence results obtained after measurements of the chemical composition. The spectrometers used in SEM or as separate XRFs can be compared due to the principle of operation. The main difference in EDS/WDX or XRF is the types of a beam that excite the characteristic X-rays radiation peaks. Unfortunately, both types of spectroscopy have limitations due to materials properties such as the application light chemical elements in alloys an example of B. As well as small quantities of chemical elements in used alloys that affect the obtained results.

• Periodical: Solid State Phenomena (Volume 326)
• Pages: 185-190
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.326.185
• Online since: November 2021
• Authors: Dawid Szyba*
• Keywords: Chemical Composition, Material Properties, Microscopic Characterization

References

[1] Dorey R., Ceramic Thick Films for MEMS and Microdevices: Microstructure-property relationships. Elsavier. Kidlington. UK. 2012. 85-86.

DOI: 10.1016/b978-1-4377-7817-5.00004-3

[2] Ashby M., Cope E., Cebon D., Informatics for Materials Science and Engineering Data-driven Discovery for Accelerated Experimentation and Application: Materials Selection for Engineering Design. Elsavier. Kidlington. UK. 2019. 219-220.

DOI: 10.1016/b978-0-12-394399-6.00010-2

[3] Tanzi M. C., Farè S., Candiani G., Foundations of Biomaterials Engineering: Organization, Structure, and Properties. Elsavier. Kidlington. UK. 2019. 3-4.

DOI: 10.1016/b978-0-08-101034-1.00001-3

[4] Batalha G. F., Materials Properties and Integrity Characterization. Reference Module in Materials Science and Materials Engineering. Science Direct 2016. 1-6.

DOI: 10.1016/b978-0-12-803581-8.04096-0

[5] Qin Y., Micromanufacturing Engineering and Technology: Overview of Micro-Manufacturing Elsavier. Kidlington. UK. 2015. 6-7.

[6] Wavelength Dispersive X-Ray Microanalysis, Oxford Instruments Analytical -Technical Briefing, 2002. UK, Ref: OIA/011/B/0502.

[7] How WDS and Parallel Beam Spectroscopy Work, Thermo Fisher Scientific,White Paper: 51402, 2007. USA, WP51402_E 10/07M.

[8] Berlin J., Analysis of Boron with Energy Dispersive X-ray Spectrometry: Advances in light element Analysis with SDD Technology. Imaging & Microscopy 13 (2011) 19–21.

[9] PNSensor - Forschung und Entwicklung moderner StrahlungsdetektorenSilicon Drift Detector Development, Link: http://www.pnsensor.de/Welcome/Detectors/SDD/index.php.

[10] Materiały: EDAX, Oxford Instruments, JEOL, Link: https://www.metalogis.com/baza-wiedzy/spektrometria-rentgenowska-xrf-podstawy-teoretyczne.

[11] Schalm O., Cabal A., Espen P. V, Laquiere N., Storme P. Improved radiographic methods for the investigation of paintings using laboratory and synchrotron X-ray sources. Journal of Analytical Atomic Spectrometry. 26 (2011) 1068-1077.

DOI: 10.1039/c0ja00242a

[12] Szyba D., Bajorek A., Babilas R., Structural and electrochemical study of resorbable Ca32Mg12Zn38Yb18-xBx (x=1, 2, 3) metallic glasses in Ringer's solution, Journal of Alloys and Compounds 815 (2020) 152313.

DOI: 10.1016/j.jallcom.2019.152313