Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 51-52)

Edited by:

S. Pizzini, H.P. Strunk and J.H. Werner

Pages:

585-596

DOI:

10.4028/www.scientific.net/SSP.51-52.585

Citation:

G. Fortunato "Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors", Solid State Phenomena, Vols. 51-52, pp. 585-596, 1996

Online since:

May 1996

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.