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HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Lifetime and Material Characteristics of...

Lifetime and Material Characteristics of Multicrystalline Silicon Measured with High Spatial Resolution

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Polycrystalline Semiconductors IV

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Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

69-74

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.69

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Online since:

May 1996

Authors:

Stephan W. Glunz, C. Hebling, W. Warta

Keywords:

Contacless Lifetime Mapping, Dislocation, Fourier-Transform Spectroscopy, Impurity Denuded Zone, Minority Carrier Lifetime, Modulated Free-Carrier Absoption, Oxygen, Solar Cell, Thermal Treatment

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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