Critical Resolved Shear Stress for a Dislocation Loop Growth, Stability and Retrogrowth in Silicon: Application to the 16 MEG DRAM

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Periodical:

Solid State Phenomena (Volumes 57-58)

Edited by:

C. Claeys, J. Vanhellemont, H. Richter and M. Kittler

Pages:

275-286

DOI:

10.4028/www.scientific.net/SSP.57-58.275

Citation:

B. Leroy "Critical Resolved Shear Stress for a Dislocation Loop Growth, Stability and Retrogrowth in Silicon: Application to the 16 MEG DRAM", Solid State Phenomena, Vols. 57-58, pp. 275-286, 1997

Online since:

July 1997

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$35.00

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