Influence of Electric Field-Enhanced Emission on Deep Level Transient Spectra of Bandlike Extended Defects: NiSi2-Precipitates in Silicon

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Periodical:

Solid State Phenomena (Volumes 57-58)

Edited by:

C. Claeys, J. Vanhellemont, H. Richter and M. Kittler

Pages:

293-298

DOI:

10.4028/www.scientific.net/SSP.57-58.293

Citation:

H. Hedemann and W. Schröter, "Influence of Electric Field-Enhanced Emission on Deep Level Transient Spectra of Bandlike Extended Defects: NiSi2-Precipitates in Silicon", Solid State Phenomena, Vols. 57-58, pp. 293-298, 1997

Online since:

July 1997

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