Electrical Activity and Impurity Precipitation in Silicon Grain Boundaries
p.265
p.265
Photo-Thermal Ionization Spectroscopy of Point Defects in Semiconductors
p.277
p.277
Kink-Point Defect Interaction and Mobility of Dislocations in Semiconductors
p.289
p.289
I. Conductivity Along Dislocations: Temperature Dependence and Nonlinear Effects II. Combined Resonance and Structure Peculiarities of Plastically Deformed Silicon
p.301
p.301
Recrystallization and Defect Formation in Ion-Implanted Silicon Studied by Transmission Electron Microscopy
p.309
p.309
Auger Recombination in Heavily-Doped p+ Silicon
p.315
p.315
Photo-Capacitive Spectroscopy of Sulphur Atoms and Heat Treatment Defects in n-Si
p.323
p.323
EPR Detection of Complex Platinum-Related Defects in Silicon
p.329
p.329
Defect Kinetics and Impurity Diffusion During Hot Implants Into Silicon
p.335
p.335
Recrystallization and Defect Formation in Ion-Implanted Silicon Studied by Transmission Electron Microscopy
Abstract:
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Periodical:
Solid State Phenomena (Volumes 6-7)
Pages:
309-314
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Online since:
January 1989
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© 1989 Trans Tech Publications Ltd. All Rights Reserved
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