Photo-Thermal Ionization Spectroscopy of Point Defects in Semiconductors
p.277
p.277
Kink-Point Defect Interaction and Mobility of Dislocations in Semiconductors
p.289
p.289
I. Conductivity Along Dislocations: Temperature Dependence and Nonlinear Effects II. Combined Resonance and Structure Peculiarities of Plastically Deformed Silicon
p.301
p.301
Recrystallization and Defect Formation in Ion-Implanted Silicon Studied by Transmission Electron Microscopy
p.309
p.309
Auger Recombination in Heavily-Doped p+ Silicon
p.315
p.315
Photo-Capacitive Spectroscopy of Sulphur Atoms and Heat Treatment Defects in n-Si
p.323
p.323
EPR Detection of Complex Platinum-Related Defects in Silicon
p.329
p.329
Defect Kinetics and Impurity Diffusion During Hot Implants Into Silicon
p.335
p.335
The Peculiarities of Deep Level Defect Passivation in SI by Atomic Hydrogen
p.341
p.341
Auger Recombination in Heavily-Doped p+ Silicon
Abstract:
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Periodical:
Solid State Phenomena (Volumes 6-7)
Pages:
315-322
Citation:
Online since:
January 1989
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© 1989 Trans Tech Publications Ltd. All Rights Reserved
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