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Paper Titles
I. Conductivity Along Dislocations: Temperature Dependence and Nonlinear Effects II. Combined Resonance and Structure Peculiarities of Plastically Deformed Silicon
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Recrystallization and Defect Formation in Ion-Implanted Silicon Studied by Transmission Electron Microscopy
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Auger Recombination in Heavily-Doped p+ Silicon
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Photo-Capacitive Spectroscopy of Sulphur Atoms and Heat Treatment Defects in n-Si
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EPR Detection of Complex Platinum-Related Defects in Silicon
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Defect Kinetics and Impurity Diffusion During Hot Implants Into Silicon
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The Peculiarities of Deep Level Defect Passivation in SI by Atomic Hydrogen
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Dislocation Motion in Compound Semiconductors
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Dislocation Structures after Microdeformation of CaAs Single Crystals
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EPR Detection of Complex Platinum-Related Defects in Silicon

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Periodical:

Solid State Phenomena (Volumes 6-7)

Pages:

329-334

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.6-7.329

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Online since:

January 1989

Authors:

M. Höhne

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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