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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Nanocharacterization of Semiconductors by Scanning...

Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

151-158

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.151

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Online since:

December 1998

Authors:

P. Fischer, J. Christen, M. Zacharias, H. Nakashima, K. Hiramatsu

Keywords:

GaAs Quantum Wire, Gallium Nitride (GaN), Spatially Resolved Micro Photoluminescence

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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