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Electrical Behaviour of Crystal Defects in Silicon Solar Cells
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LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
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Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
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Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79LBIC Control Mapping of Textured Silicon Thin Film...

LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid

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Beam Injection Assessment of Microstructures in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

49-56

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.49

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Online since:

April 2001

Authors:

A. Fave, J.P. Boyeaux, Mustapha Lemiti, A. Laugier, P. Kleimann, Jan Linnros

Keywords:

Crystalline Silicon, LBIC, Liquid Phase Epitaxy (LPE), Thin Film

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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